|Nanofactory Instruments proudly introduces our latest products in Electrical Probing,
HE100.x6 Single tilt Elecrical Probing Holder and HS100.x6 Single tilt STM-TEM
Electrical Probing Holder.
The products are particularly developed for research on Nanowires and Nanotubes,
Battery materials, thin film samples etc.
With the X6 version of the holder, pre-fabricated chips or MEMS structures can be
mounted on a specimen carrier with up to 6 electrical contacts. This enables
simultaneous driving and probing of electrical circuits while observing related
structural changes in the TEM.
For more detailed information please contact firstname.lastname@example.org