Nanofactory sells dedicated TEM holders and control electronics for in situ probing of electrical and mechanical properties of nanostructures:
single-tilt and double tilt TEM holders for electrical and force nanoprobing
TEM-Nanoindenter systems for in situ nanoindentation
scanning STM-TEM and TEM-AFM nanoprobing systems
The key benefits of TEM in situ probing techniques lie in the abilities to
locate and align a probe to nanoscale objects with high precision
characterize both object and probe by high resolution imaging using TEM
carry out electrical and mechanical probing in situ
study dynamical processes
Nanowires, nanotubes, nanoparticles, semiconductor devices and nanostructures, electro-mechanical testing, nanomechanics, electromigration, high current/fields, failure, hardness.
Heterojunctions between metals and carbon nanotubes as ultimate nanocontacts PNAS vol 106 p45914595 (2009), J.A. Rodrνguez-Manzo, F. Banhart, M. Terrones, H. Terrones, N. Grobert, P.M. Ajayan, B.G. Sumpter, V. Meunier, M. Wang, Y. Bando, and D. Golberg.
A high-density array of size-controlled silicon nanodots in a silicon oxide nanowire by electron-stimulated oxygen expulsion Nano Lett. 9 p17801786 (2009), G.-S. Park, E. K. Lee, J. H. Lee, J. Park, S. K. Kim, X. S. Li, J. C. Park, J. G. Chung, W. S. Jeon, S. Heo, J. H. Lee, B. L. Choi and J. M. Kim.
Quantitative evaluation of plasticity of a ductile nano-component Thin Solid Films 516 p19251930 (2008), Y. Takahashi, H. Hirakata, T. Kitamura.