Nanofactory sells dedicated TEM holders and control electronics for in situ probing of electrical and mechanical properties of nanostructures:

• single-tilt and double tilt TEM holders for electrical and force nanoprobing
• TEM-Nanoindenter systems for in situ nanoindentation
• scanning STM-TEM and TEM-AFM nanoprobing systems


Benefits

The key benefits of TEM in situ probing techniques lie in the abilities to
• locate and align a probe to nanoscale objects with high precision
• characterize both object and probe by high resolution imaging using TEM
• carry out electrical and mechanical probing in situ
• study dynamical processes


Selected applications

SWCNT/MWCNT, Nanowires, nanotubes, nanoparticles, composites, polymers, catalysts, bionanomaterials, electro-mechanical properties, high currents/fields, nanomechanics, dislocation propagation, hardness, strain, stress.


Selected articles

Controlled formation of sharp zigzag and armchair edges in graphitic nanoribbons – Science 323 p1701-1705 (2009), X. Jia, M. Hofmann, V. Meunier, B. G. Sumpter, J. Campos-Delgado, J. M. Romo-Herrera, H. Son, Y.-P. Hsieh, A. Reina, J. Kong, Mauricio Terrones, Mildred S. Dresselhaus.

Plumbing carbon nanotubes – Nature Nanotech. 3, p17-21 (2008), C. Jin, K. Suenaga and S. Iijima.

Semiconducting properties of cup-stacked carbon nanotubes current – Carbon 47 p731-736 (2009), Q. Liu, W. Ren, Z.-G. Chen, L. Yin, F. Li, H. Cong, H.-M. Cheng.

Carbon nanotubes as nanoscale mass conveyors – Nature vol 428, p 924-927 (2004), B. C. Regan, S. Aloni, R. O. Ritchie, U. Dahmen, and A. Zettl.

Low-friction nanoscale linear bearing realized from multiwall carbon nanotubes – Science vol 289, p 602 (2000), J. Cumings and A. Zettl.