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Nanofactory sells dedicated TEM holders and control electronics for in situ probing of electrical and mechanical properties of nanostructures:
• single-tilt and double tilt TEM holders for electrical and force nanoprobing
• TEM-Nanoindenter systems for in situ nanoindentation
• scanning STM-TEM and TEM-AFM nanoprobing systems
Benefits
The key benefits of TEM in situ probing techniques lie in the abilities to
• locate and align a probe to nanoscale objects with high precision
• characterize both object and probe by high resolution imaging using TEM
• carry out electrical and mechanical probing in situ
• study dynamical processes
Selected applications
Nanowires, nanotubes, nanoparticles, SWCNT/MWCNT, electronic properties, nanomechanics, electron and mass transport, field emission, correlated electron-devices, phase transitions, dislocation propagation.
Selected Articles
Controlled formation of sharp zigzag and armchair edges in graphitic nanoribbons – Science 323 p1701-1705 (2009), X. Jia, M. Hofmann, V. Meunier, B. G. Sumpter, J. Campos-Delgado, J. M. Romo-Herrera, H. Son, Y.-P. Hsieh, A. Reina, J. Kong, Mauricio Terrones, Mildred S. Dresselhaus.
Vacancy migrations in carbon nanotubes – Nano Letters vol 8, p1127–1130 (2008), C. Jin, K. Suenaga and S. Iijima.
Real time microscopy, kinetics, and mechanism of giant fullerene evaporation – Phys. Rev. Lett. 99, p175503/1-4 (2007), J. Y. Huang, F. Ding, K. Jiao, and B. I. Yakobson.
Polaron melting and ordering as key mechanisms for colossal resistance effects in manganites – PNAS vol 104 p13597–13602 (2007), Ch. Jooss, L.Wu, T. Beetz, R. F. Klie, M. Beleggia, M. A. Schofield, S. Schramm, J. Hoffmann, and Y. Zhu.
Atomic-scale imaging of wall-by-wall breakdown and concurrent transport measurements in multiwall carbon nanotubes – Phys. Rev. Lett. vol 94, p 236802 (2005), J.Y. Huang, S. Chen, S. H. Jo, Z. Wang, D. X. Han, G. Chen, M. S. Dresselhaus, and Z. F. Ren.
Carbon nanotube quantum resistors – Science vol 280, p 1744-1746 (1998), S. Frank, P. Poncharal, Z. L. Wang, W. A. de Heer.
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