Nanofactory sells dedicated TEM holders and control electronics for in situ probing of electrical and mechanical properties of nanostructures:
single-tilt and double tilt TEM holders for electrical and force nanoprobing
TEM-Nanoindenter systems for in situ nanoindentation
scanning STM-TEM and TEM-AFM nanoprobing systems
The key benefits of TEM in situ probing techniques lie in the abilities to
locate and align a probe to nanoscale objects with high precision
characterize both object and probe by high resolution imaging using TEM
carry out electrical and mechanical probing in situ
study dynamical processes
Nanowires, nanotubes, nanoparticles, SWCNT/MWCNT, electronic properties, nanomechanics, electron and mass transport, field emission, correlated electron-devices, phase transitions, dislocation propagation.
Controlled formation of sharp zigzag and armchair edges in graphitic nanoribbons Science 323 p1701-1705 (2009), X. Jia, M. Hofmann, V. Meunier, B. G. Sumpter, J. Campos-Delgado, J. M. Romo-Herrera, H. Son, Y.-P. Hsieh, A. Reina, J. Kong, Mauricio Terrones, Mildred S. Dresselhaus.
Vacancy migrations in carbon nanotubes Nano Letters vol 8, p11271130 (2008), C. Jin, K. Suenaga and S. Iijima.
Real time microscopy, kinetics, and mechanism of giant fullerene evaporation Phys. Rev. Lett. 99, p175503/1-4 (2007), J. Y. Huang, F. Ding, K. Jiao, and B. I. Yakobson.
Polaron melting and ordering as key mechanisms for colossal resistance effects in manganites PNAS vol 104 p1359713602 (2007), Ch. Jooss, L.Wu, T. Beetz, R. F. Klie, M. Beleggia, M. A. Schofield, S. Schramm, J. Hoffmann, and Y. Zhu.
Atomic-scale imaging of wall-by-wall breakdown and concurrent transport measurements in multiwall carbon nanotubes Phys. Rev. Lett. vol 94, p 236802 (2005), J.Y. Huang, S. Chen, S. H. Jo, Z. Wang, D. X. Han, G. Chen, M. S. Dresselhaus, and Z. F. Ren.
Carbon nanotube quantum resistors Science vol 280, p 1744-1746 (1998), S. Frank, P. Poncharal, Z. L. Wang, W. A. de Heer.